Microscopy and Characterization Suite (MaCS)

MaCS Lab

Lab Lead: Joanna Taylor, (208) 533-8178

Focused Ion Beam with EDS/EBSD/Omniprobe

Manufacturer: FEI Company
Model: Quanta 3D FEG
Instrument Lead: Jatu Burns, (208) 533-8160

Local Electrode Atom Probe (LEAP)

Manufacturer: CAMECA Instruments Inc. (Formerly Imago Scientific Instruments)
Model: LEAP 4000X HR
Instrument Lead: Yaqiao Wu, (208) 533-8112

Nanoindenter and Atomic Force Microscope (AFM)

Manufacturer: Hysitron
Model: TI-950 TriboIndenter
Instrument Lead: Jatu Burns, (208) 533-8160

Scanning Electron Microscope (SEM) with EDS/EBSD/CL

Manufacturer: JEOL USA Inc.
Model: JSM-6610LV
Instrument Lead: Jatu Burns, (208) 533-8160

Transmission Electron Microscope (TEM)

Manufacturer: FEI Company
Model: Tecnai TF30-FEG STwin STEM
Instrument Lead: Yaqiao Wu, (208) 533-8112

 



Sample Preparation Equipment - Non-Radioactive

Sample Prep Lead: Bryan Forsmann, (208) 533-8161


Linear Sectioning Machine

Manufacturer: LECO
Model: MSX-205MZ

 

Polisher/Grinder

Manufacturer: LECO
Model: SS-1000 Spectrum System

 

Polisher/Polisher

Manufacturer: LECO
Model: GPX-200

 

Precision Saw

Manufacturer: Buehler
Model: SS-1000 Spectrum System

 

Viboratory Polisher

Manufacturer: Buehler
Model: VibroMet 2

 

 



Sample Preparation Equipment - Radioactive


Low Speed Saw

Manufacturer: Buehler
Model: Isoment Low Speed Saw

 

Polisher/Grinder

Manufacturer: Buehler
Model: Minimet 1000 polisher/grinder