CAES Microscopy and Characterization Suite (MaCS)

 

MaCS Lab

Lab Lead: Joanna Taylor, (208) 533-8178

Sample Preparation Equipment

NON-RADIOACTIVE

Focused Ion Beam with EDS/EBSD/Omniprobe

Instrument Lead: Jatu Burns, (208) 533-8160
Manufacturer: FEI Company
Model: Quanta 3D FEG
Website: Click here

Linear Sectioning Machine

Manufacturer: KECI
Model:MSX-205MZ
Website: Click here

Local Electrode Atom Probe (LEAP)

Instrument Lead: Yaqiao Wu, (208) 533-8112
Manufacturer: CAMECA Instruments Inc. (Formerly Imago Scientific Instruments)
Model: LEAP 4000X HR
Website: Click here

Polisher/Grinder

Manufacturer: LECO
Model: SS-1000 Spectrum System
Website: Click here

Nano Indenter Atomic Force Microscope

Instrument Lead: Maria Okuniewski, (208) 533-7187
Manufacturer: Hysitron
Model: TI-950 TriboIndenter
Website: Click here

Polisher/Polisher

Manufacturer: LECO
Model:GPX-200
Website: Click here

Scanning Electron Microscope (SEM) with EDS/EBSD/CL 

Instrument Lead: Jatu Burns, (208) 533-8160
Manufacturer: JEOL USA Inc.
Model: JSM-6610LV
Website: Click here

Precision Saw

Manufacturer: Buehler
Model: ISOMET 1000
Website: Click here

Transmission Electron Microscope (TEM)

Instrument Lead: Yaqiao Wu, (208) 533-8112
Manufacturer: FEI Company
Model: Tecnai TF30-FEG STwin STEM
Website: Click here

Viboratory Polisher

Manufacturer: Buehler
Model:VibroMet 2
Website: Click here
 

RADIOACTIVE

 

Low Speed Saw

Manufacturer: Buehler
Model:Isoment Low Speed Saw
Website: Click here
 

Polisher/Grinder

Manufacturer: LECO
Model: Minimet 1000 polisher/grinder
Website: Click here